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JAEA Reports

Chemisorption of CH$$_{3}$$Cl on Si(001) surface under UHV condition

Imanaka, Soichi*; Okada, Michio*; Kasai, Toshio*; Teraoka, Yuden; Yoshigoe, Akitaka

JAERI-Tech 2003-066, 36 Pages, 2003/08

JAERI-Tech-2003-066.pdf:7.13MB

The reactions of organic molecules with a Si(001) surface play important roles in many applied fields such as LSI, molecular device, sensor, non-liner optical materials, catalysis, coating, preservation from decay, and so on. Especially, the dissociative adsorption of CH$$_{3}$$Cl is an important initial process in the production of diamond and silicon carbide thin films. However, it is required to control the orientation of CH$$_{3}$$Cl for the elucidation of the detailed mechanism of the dissociative adsorption. In the present experiments, we studied the dissociative adsorption of CH$$_{3}$$Cl on a clean Si(001) surface under ultra-high vacuum using Scanning Tunneling Microscopy (STM). We found, for the first time, that there are two reaction passes of CH$$_{3}$$Cl(g) to CH$$_{3}$$(a)+Cl(a) and CH$$_{3}$$Cl(g) to CH$$_{3}$$(a)+Cl(g) in the dissociative adsorption of CH$$_{3}$$Cl on the Si${001}$ surface.

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